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PaperSystem for direct measurement of the step response of electronic devices on the picosecond time scaleJ.A. Sheridan, D.M. Bloom, et al.Optics Letters
Conference paperA self-aligned silicide process for thin silicon-on-insulator MOSFETs and bulk MOSFETs with shallow junctionsG.M. Cohen, C. Cabral Jr., et al.MRS Proceedings 2001
PaperRoom-temperature electron trapping in Al0.35Ga 0.65As/GaAs modulation-doped field-effect transistorsMarshall I. Nathan, P.M. Mooney, et al.Applied Physics Letters
