P. Solomon
Applied Physics Letters
Paper
IIA-2 Saturable Charge FET
Abstract
No abstract available.
Related
H. Baratte, Paul M. Solomon, et al.
IEEE Electron Device Letters
Conference paper
Calculating the error in long term oxide reliability estimates
B.P. Linder, J.H. Stathis, et al.
IRPS 2001
D.J. Frank
LPED 1996