Toshiaki Kirihata, Martin Gall, et al.
IEEE Journal of Solid-State Circuits
Paper
IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
Abstract
No abstract available.
Related
Osamu Takahashi, Sang H. Dhong, et al.
IEEE Journal of Solid-State Circuits
Toshiaki Kirihata, Yohji Watanabe, et al.
IEICE Transactions on Electronics
Charles C.-H. Hsu, Duen-Shun Wen, et al.
IEEE Transactions on Electron Devices