Z. Kovats, T. Salditt, et al.
Journal of Physics D: Applied Physics
In this letter, we present results of enhancement and depletion mode transistors fabricated on the same layer structure of Si/SiGe, without using gate recess. The current in the enhancement mode device is controlled by a pn-junction, while that of the depletion-mode device is controlled by a Schottky barrier. A peak transconductance of 327 mS/mm and 417 mS/mm has been achieved in 0.5-μm gate length depletion and enhancement-mode transistors, respectively.
Z. Kovats, T. Salditt, et al.
Journal of Physics D: Applied Physics
P.M. Mooney, J.O. Chu, et al.
Journal of Electronic Materials
K.Y. Lee, S.J. Koester, et al.
Microelectronic Engineering
M. Arafa, P. Fay, et al.
IEEE Electron Device Letters