Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
An apparatus for deep-ultraviolet interferometric lithography is described, in which the interfering beams illuminate the substrate through a fused silica prism and a layer of index-matching liquid. The liquid-immersion technique was found to be compatible with a commercially available, chemically amplified photoresist. The apparatus was used with a 257 nm light source to write gratings having a period of 97 nm and linewidth of approximately 40 nm. © 1999 American Vacuum Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Ming L. Yu
Physical Review B
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta