Jeng-Bang Yau, Jin Cai, et al.
IEEE T-ED
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Jeng-Bang Yau, Jin Cai, et al.
IEEE T-ED
Denny Duan-Lee Tang, Tze-Chiang Chen, et al.
IEEE T-ED
G.P. Li, Tze-Chiang Chen, et al.
IEEE Electron Device Letters
Pouya Hashemi, Jeng-Bang Yau, et al.
S3S 2017