Tak H. Ning
IBM J. Res. Dev
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Tak H. Ning
IBM J. Res. Dev
Tak H. Ning
SPIE Advanced Lithography 2007
Sufi Zafar, Marwan Khater, et al.
Applied Physics Letters
Denny Duan-Lee Tang, Tze-Chiang Chen, et al.
IEEE T-ED