Pouya Hashemi, Jeng-Bang Yau, et al.
S3S 2017
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Pouya Hashemi, Jeng-Bang Yau, et al.
S3S 2017
Pong-Fei Lu, Denny D. Tang
Solid State Electronics
Siegfried K. Wiedmann, Denny D. Tang
ISSCC 1981
Denny D. Tang, Edward Hackbarth, et al.
IEEE T-ED