Journal of Microscopy

Paper

02 Aug 2011

Method for measuring the field from a magnetic recording head in the scanning electron microscope

View publication

Abstract

No abstract available.

Paper

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

Conference paper

Applications of image diagnostics to metrology quality assurance and process control

John A. Allgair, Victor V. Boksha, et al.

SPIE Advanced Microelectronic Manufacturing 2003

Paper

Low-loss image for surface scanning electron microscope

Oliver C. Wells

Applied Physics Letters

Paper

Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

View all publications