D.E. Eastman, C.B. Stagarescu, et al.
Physical Review Letters
Columnar microstructure in step-graded [Formula presented] structures with low threading dislocation densities has been determined using high angular resolution ([Formula presented]) x-ray microdiffraction. X-ray rocking curves of a [Formula presented]-thick strain-relaxed [Formula presented] film show many sharp peaks and can be simulated with a model having a set of Gaussians having narrow angular widths (0.013°–0.02°) and local ranges of tilt angles varying from 0.05° to 0.2°. These peaks correspond to individual tilted rectangular columnar micrograins having similar (001) lattice spacings and average areas of 0.8 to [Formula presented]. © 2002 The American Physical Society.
D.E. Eastman, C.B. Stagarescu, et al.
Physical Review Letters
X. Su, C.B. Stagarescu, et al.
Applied Physics Letters
Guangyong Xu, X. Su, et al.
Applied Physics Letters
Guangyong Xu, D.E. Eastman, et al.
Journal of Applied Physics