Conference paperImaging at high beam energies in the scanning electron microscopeL. Gignac, S.H. Boettcher, et al.M&M 2006
PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lensO.C. WellsScanning
Conference paperStudies of poorly conducting samples by the low-loss electron method in the scanning electron microscopeO.C. Wells, S. RishtonMSA Annual Meeting 1994
PaperStudies of samples having shallow surface topography by the low-loss electron (LLE) method in the scanning electron microscope (SEM)O.C. Wells, Maurice McGlashen-Powell, et al.Scanning