True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Based on UV measurements at 157 nm of in-house fluoropolymers we have selected α-trifluoromethylacrylate and norbornene beating a pendant hexafluoroisopropanol group as our building blocks for 157 nm resist polymers. Polymers consisting of these repeat units have an optical density/μm of 3 or below at 157 nm. We have found that the α-trifluoromethylacrylate derivatives conveniently undergo radical copolymerization with norbornenes, which has provided a breakthrough in preparation of our 157 nm resist polymers. This approach offers flexibility and versatility because an acidic moiety or acid-labile group can be placed in either acrylate or norbornene repeat unit. Other platforms of interest include all-acrylic, all-norbornene, and acrylic-styrenic polymers. © 2001 SPIE - The International Society for Optical Engineering.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Robert D. Allen, Carl E. Larson, et al.
J. Photopolym. Sci. Tech.