PaperA Scaled 0.25- μm Bipolar Technology Using Full e-Beam LithographyJohn D. Cressler, James Warnock, et al.IEEE Electron Device Letters
Conference paperReliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologiesJae-Joon Kim, Barry P. Linder, et al.IRPS 2011
PaperLAn 11-GHz 3-V siGe voltage controlled oscillator with integrated resonatorMehmet Soyuer, Joachim N. Burghartz, et al.IEEE Journal of Solid-State Circuits
PaperUse of voltage contrast to locate defects in patterned high-Tc filmsKeith A. Jenkins, Byungdu OhJournal of Applied Physics
