Oliver C. Wells
Scanning
Paper
Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)
Related
Conference paper
Past, present, and future of backscatter electron (BSE) imaging
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
Oliver C. Wells, Catherine A. Stoye
Journal of Microscopy
Kenneth C.A. Smith, Oliver C. Wells, et al.
IC-CPO 2006