Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

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Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

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Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope

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Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

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Scanning

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