PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
Conference paperPast, present, and future of backscatter electron (BSE) imagingOliver C. Wells, Michael S. Gordon, et al.ScMi 2012
PaperLow-loss electron images of uncoated photoresist in the scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments