Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

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Magnetically filtered low-loss scanning electron microscopy

Oliver C. Wells, Eric Munro

Ultramicroscopy

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Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

Oliver C. Wells

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Low-loss image for surface scanning electron microscope

Oliver C. Wells

Applied Physics Letters

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