Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Conference paper

The history and future of the SEM - A personal view

Oliver C. Wells

M&M 2006

Paper

Top-down topography of deeply etched silicon in the scanning electron microscope

Oliver C. Wells, Conal E. Murray, et al.

Review of Scientific Instruments

Paper

Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope

Oliver C. Wells, Ping-Chin Cheng

Journal of Applied Physics

Paper

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

View all publications