PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
ReviewEffects of collector take‐off angle and energy filtering on the BSE image in the SEMOliver C. WellsScanning
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
