Xiao Sun, Christopher P. D’Emic, et al.
VLSI Technology 2017
Near InfraRed (NIR) photon emission is observed from filaments in HfO2 Resistive Random Access Memories (ReRAMs). This technique is non-destructive and offers rapid localization of filaments, enabling statistical analysis of their spatial distribution. We show that the emission is electric-field driven. We also report direct experimental evidence of ) completely random spatial distribution of filaments across multiple devices and ii) formation of multiple filaments inside a single large device.
Xiao Sun, Christopher P. D’Emic, et al.
VLSI Technology 2017
Franco Stellari, Cyril Cabral, et al.
IEDM 2019
Franco Stellari, Peilin Song, et al.
ISTFA 2008
Siddarth Krishnan, Vijay Narayanan, et al.
IRPS 2012