GROWTH OF THIN OXIDE LAYERS ON SILICIDE COMPOUNDS.
- A. Cros
- 1982
- International Symposium on Passivity 1982
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11 results for A. Cros
Thermal oxidation of silicides on silicon
- F.M. D’Heurle
- A. Cros
- et al.
- 2007
- Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Formation, oxidation, electronic, and electrical properties of copper silicides
- A. Cros
- M.O. Aboelfotoh
- et al.
- 1990
- Journal of Applied Physics
Schottky-barrier behavior of copper and copper silicide on n-type and p-type silicon
- M.O. Aboelfotoh
- A. Cros
- et al.
- 1990
- Physical Review B
Low-temperature amorphous-to-crystalline transformation of CoSi2 films
- A. Cros
- K.N. Tu
- et al.
- 1988
- Applied Physics Letters
Stability of oxides grown on tantalum silicide surfaces
- A. Cros
- K.N. Tu
- 1986
- Journal of Applied Physics
Resistivity of the solid solutions (Co-Ni)Si2
- F.M. D'Heurle
- J. Tersoff
- et al.
- 1986
- Journal of Applied Physics
Influence of sputtering damage on chemical interactions at Cr-SiO 2 interfaces
- A. Cros
- A.G. Schrott
- et al.
- 1986
- Applied Physics Letters
Room-temperature oxidation of Ni, Pd, and Pt silicides
- A. Cros
- R.A. Pollak
- et al.
- 1985
- Journal of Applied Physics
Interaction between chromium oxide and chromium silicide
- A. Cros
- R.A. Pollak
- et al.
- 1983
- Journal of Applied Physics