PaperOn the role of interface states in low-voltage leakage currents of metal-oxide-semiconductor structuresF. Crupi, C. Ciofi, et al.Applied Physics Letters
Conference paperPBTI relaxation dynamics after ac VS. DC stress in high-K/metal gate stacksK. Zhao, J.H. Stathis, et al.IRPS 2010
PaperMicroscopic mechanisms of interface state generation by electrical stressJ.H. StathisMicroelectronic Engineering
Conference paperLaser conditioning and electronic defects of HfO2and SiO2thin filmsM.R. Kozlowski, M. Staggs, et al.SPIE Laser-Induced Damage in Optical Materials 1990