H. Rupprecht, G.H. Schwuttke
Journal of Applied Physics
The electrical and optical properties of GaAs diodes with three-layer structures are described. The center layer was either n-type (n +-n-p+ diodes), semi-insulating (n+-i-p + diodes) or p-type (n+-p-p+ diodes). The spontaneous emission lines from n+-n-p+ diodes were studied in detail. For a low doping level of the n layer they can be interpreted by assuming hole recombination on the n side of the p+-n junction. Lasing occurred in a 1.5-eV line and in second-order transverse modes. Small vertical beamspreads were observed. Optical gain factor and laser losses are discussed. Stimulated emission was not obtained when the n layer was very thick. n+-i-p+ diodes had a Cr-doped middle region and showed a negative resistance at 300°K. Lasing occurred in the 1.48-eV line. n +-p-p+ diodes showed emission lines attributed to tunneling. Lasing occurred in the 1.48-eV line. The temperature dependence of the threshold current density is discussed. © 1966 The American Institute of Physics.
H. Rupprecht, G.H. Schwuttke
Journal of Applied Physics
H. Rupprecht, C.Z. Lemay
Journal of Applied Physics
N.G. Ainslie, M.H. Pilkuhn, et al.
Journal of Applied Physics
M.H. Pilkuhn, H. Rupprecht
IEEE T-ED