Sung K. Kang, Stephen L. Buchwalter, et al.
Proceedings - Electronic Components and Technology Conference
The presence of a Cu layer either under or over the Ni layer was evaluated by varying the thickness of Cu and Ni. The type of Ni plating, either electrolytic or electroless, serving as a reaction/diffusion barrier, was also investigated. Overall, the results provide a detailed understanding of the interfacial reactions, which leads to the designing of a more reliable metallurgical system for Pb-free solder joints.
Sung K. Kang, Stephen L. Buchwalter, et al.
Proceedings - Electronic Components and Technology Conference
Lei Shan, Daniel Kuchta, et al.
ECTC 2003
Sung K. Kang, M.G. Cho, et al.
Journal of Materials Research
Paul Lauro, Sung K. Kang, et al.
Journal of Electronic Materials