S.L. Wright, R.F. Marks, et al.
Applied Physics Letters
Pseudomorphic (In,Ga)As layers are used in GaAs-based semiconductor- insulator- semiconductor (SIS) structures to shift the threshold voltage from the natural, near-zero value. The threshold voltage is shifted positively for (In,Ga)As gate layers, and negatively for (In,Ga)As channel layers, by the (In,Ga)As/GaAs conduction-band offset. The thermionic and field emission barrier heights agree with shifts obtained in capacitance-voltage characteristics. The structures withstand implant activation anneals, establishing a simple technology to create either enhancement or depletion-mode devices.
S.L. Wright, R.F. Marks, et al.
Applied Physics Letters
P.D. Kirchner, J. Woodall, et al.
IEEE T-ED
R.T. Zeller, B.B. Goldberg, et al.
Physical Review B
C.R. Lu, J.R. Anderson, et al.
Physical Review B