PaperProcess Damage and Contamination Effects for Shallow Si Implanted GaAsH. Baratte, A.J. Fleischman, et al.JES
Conference paperProcess damage and contamination effects for shallow Si implanted GaAsH. Barratte, G. Scilla, et al.ECS Meeting 1989
PaperCircular pseudo-metal oxide semiconductor field effect transistor in silicon-on-insulator analytical model, simulation, and measurementsD. Munteanu, S. Cristoloveanu, et al.Electrochemical and Solid-State Letters