Microscopy of chemical-potential variations on an atomic scale
- C.C. Williams
- H.K. Wickramasinghe
- 1990
- Nature
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18 results for C.C. Williams
Atomic force microscope: Implementations
- P.C.D. Hobbs
- Y. Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Thermal and photo thermal imaging on a sub 100 nanometer scale
- C.C. Williams
- H.K. Wickramasinghe
- 1988
- SPIE OE/LASE 1988
HIGH RESOLUTION THERMAL MICROSCOPY.
- C.C. Williams
- H.K. Wickramasinghe
- 1985
- IUS 1985
High‐resolution force microscopy of in‐plane magnetization
- David W. Abraham
- C.C. Williams
- et al.
- 2011
- Journal of Microscopy
Differential scanning tunnelling microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 2011
- Journal of Microscopy
Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Scanning capacitance microscopy on a 25 nm scale
- C.C. Williams
- W.P. Hough
- et al.
- 1989
- Applied Physics Letters
Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1989
- Applied Physics Letters
Absolute optical ranging with 200-nm resolution
- C.C. Williams
- H.K. Wickramasinghe
- 1989
- Optics Letters