0.5 μm CMOS device design and characterization
- H.I. Hanafi
- M.R. Wordeman
- et al.
- 1987
- ESSDERC 1987
Publications
Date
Featured collections
Popular topics
35 results for L.K. Wang
0. 5 MICRON GATE CMOS TECHNOLOGY USING E-BEAM/OPTICAL MIX LITHOGRAPHY.
- L.K. Wang
- Y. Taur
- et al.
- 1985
- VLSI Technology 1985
EFFECTS OF MeV IMPLANTATION ON THE CHARACTERISTICS OF p-n JUNCTIONS.
- L.K. Wang
- G.P. Li
- et al.
- 1984
- ECS Meeting 1984
Memories of tomorrow
- William Reohr
- Heinz Hönigschmid
- et al.
- 2002
- IEEE Circuits and Devices Magazine
Thermal management for high performance integrated circuits with non-uniform chip power considerations
- Tsorng-Di Yuan
- Bor Zen Hong
- et al.
- 2001
- Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Conversion of bulk CMOS circuits to SOI technology and its noise impact
- L.K. Wang
- Howard H. Chen
- 1999
- International Symposium on VLSI Technology, Systems, and Applications, Proceedings
Effect of hydrogen annealing on hot-carrier instability of X-Ray irradiated CMOS devices
- C.C.-H. Hsu
- L.K. Wang
- et al.
- 1992
- Journal of Electronic Materials
X-ray lithography induced radiation damage in CMOS and bipolar devices
- L.K. Wang
- 1992
- Journal of Electronic Materials
Radiation damage and its effect on hot-carrier induced instability of 0.5 μm CMOS devices patterned using synchrotron x-ray lithography
- C.C.-H. Hsu
- L.K. Wang
- et al.
- 1990
- Journal of Electronic Materials
Fully scaled 0.5 μm MOS circuits by synchrotron radiation X-ray lithography: Devices fabrication and overlay evaluation
- J. Silverman
- V. Dimilia
- et al.
- 1989
- Microelectronic Engineering