Photoemission sampling technique for high-speed integrated-circuit testing
- H. Beha
- H.K. Seitz
- et al.
- 1987
- Microelectronic Engineering
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14 results for H.K. Seitz
17ps rise-time measurement by photoemission sampling
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Electronics Letters
Energy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testing
- H.K. Seitz
- A. Blacha
- et al.
- 1986
- Microelectronic Engineering
VB-2 Laser-Induced Photoemission for Contactless High-Speed IC Testing
- A. Blacha
- R. Clauberg
- et al.
- 1986
- IEEE T-ED