Electrostatic discharge (ESD) protection in silicon-on-insulator (SOI) CMOS technology with aluminum and copper interconnects in advanced microprocessor semiconductor chips
- S. Voldman
- D. Hui
- et al.
- 1999
- EOS/ESD 1999
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16 results for Steven H. Voldman
Electrostatic discharge protection in silicon-on-insulator technology
- S. Voldman
- D. Hui
- et al.
- 1999
- IEEE International SOI Conference 1999
State of the art of electrostatic discharge protection: Physics, technology, circuits, design, simulation and scaling
- S. Voldman
- 1998
- BCTM 1998
Latchup in CMOS technology
- M. Hargrove
- S. Voldman
- et al.
- 1998
- IRPS 1998
CMOS-on-SOI ESD protection networks
- S. Voldman
- R. Schulz
- et al.
- 1998
- Journal of Electrostatics
Shallow trench isolation double-diobe electrostatic discharge circuit and interaction with DRAM output circuitry
- Steven H. Voldman
- Vaughn P. Gross
- et al.
- 1993
- Journal of Electrostatics