Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
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92 results for Franco Stellari
Backside flip-chip testing by means of high-bandwidth luminescence detection
- A. Tosi
- F. Stellari
- et al.
- 2003
- Microelectronics Reliability
Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2002
- ISTFA 2002
CMOS circuit analysis with luminescence measurements and simulations
- F. Stellari
- A. Tosi
- et al.
- 2002
- ESSDERC 2002
Optical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- S. Cova
- C. Porta
- et al.
- 2000
- ESSDERC 2000
High energy BSE/SE/STEM imaging of 8 um thick semiconductor interconnects
- L. Gignac
- C. Beslin
- et al.
- 2014
- Microscopy and Microanalysis
Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
Gibbs spatial process for characterization of filament interaction in ReRAM devices via photon emission microscopy
- Ernest Wu
- Franco Stellari
- et al.
- 2022
- Applied Physics Letters