Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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92 results for Franco Stellari

Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- - Alan Weger
  - Steven Voldman
  - et al.
- 2003
- IRPS 2003
Backside flip-chip testing by means of high-bandwidth luminescence detection
- - A. Tosi
  - F. Stellari
  - et al.
- 2003
- Microelectronics Reliability
Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- - R. Desplats
  - A. Eral
  - et al.
- 2003
- Microelectronics Reliability
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
- - Franco Stellari
  - Peilin Song
  - et al.
- 2002
- ISTFA 2002
CMOS circuit analysis with luminescence measurements and simulations
- - F. Stellari
  - A. Tosi
  - et al.
- 2002
- ESSDERC 2002
Optical diagnosis of excess I_DDQ in low power CMOS circuits
- - Franco Stellari
  - Peilin Song
  - et al.
- 2002
- Microelectronics Reliability
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- - S. Cova
  - C. Porta
  - et al.
- 2000
- ESSDERC 2000
High energy BSE/SE/STEM imaging of 8 um thick semiconductor interconnects
- - L. Gignac
  - C. Beslin
  - et al.
- 2014
- Microscopy and Microanalysis
Mapping and statistical analysis of filaments locations in amorphous HfO₂ ReRAM cells
- - Franco Stellari
  - Ernest Y. Wu
  - et al.
- 2023
- Microelectronics Reliability
Gibbs spatial process for characterization of filament interaction in ReRAM devices via photon emission microscopy
- - Ernest Wu
  - Franco Stellari
  - et al.
- 2022
- Applied Physics Letters