Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2016
- Electronic Device Failure Analysis
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97 results for Peilin Song
Spontaneous photon emission from 32 nm and 14 nm SOI FETs
- Franco Stellari
- Alessandro Ruggeri
- et al.
- 2016
- IRPS 2016
Revealing SRAM memory content using spontaneous photon emission
- Franco Stellari
- Peilin Song
- et al.
- 2016
- VTS 2016
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2016
- IEEE T-ED
Techniques for reverse engineering and functionality extraction of mixed-signal ICs for security applications
- Franco Stellari
- Chung Ching Lin
- et al.
- 2015
- ISTFA 2015
Effect of temperature on superconducting nanowire single-photon detector noise
- Andrea Bahgat Shehata
- Alessandro Ruggeri
- et al.
- 2015
- SPIE Nanoscience + Engineering 2015
Performance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillator
- Chih-Hsiang Ho
- Keith A. Jenkins
- et al.
- 2015
- IEEE T-ED
Analyzing path delays for accelerated testing of logic chips
- Emily Ray
- Barry P. Linder
- et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
Time-integrated photon emission as a function of temperature in 32 nm CMOS
- Andrea Bahgat Shehata
- Alan J. Weger
- et al.
- 2015
- IRPS 2015