An on-chip jitter measurement circuit with sub-picosecond resolution
- Keith A. Jenkins
- Anup P. Jose
- et al.
- 2005
- ESSCIRC 2005
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236 results for Keith A. Jenkins
Stress memorization in high-performance FDSOI devices with ultra-thin silicon channels and 25nm gate lengths
- D. Singh
- J. Sleight
- et al.
- 2005
- IEDM 2005
Assembly technology for three dimensional integrated circuits
- A. Topol
- D.C. La Tulipe
- et al.
- 2005
- VMIC 2005
A circuit-sensitive methodology for evaluating substrate noise
- John Liobe
- Keith A. Jenkins
- 2005
- RFIC 2005
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis
Direct measurements of frequency response of carbon nanotube field effect transistors
- D. Singh
- Keith A. Jenkins
- et al.
- 2005
- Electronics Letters
Laterally scaled Si-Si0.7Ge0.3 n-MODFETs with fmax > 200 GHz and low operating bias
- S.J. Koester
- K.L. Saenger
- et al.
- 2005
- IEEE Electron Device Letters
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection
- John U. Knickerbocker
- Paul S. Andry
- et al.
- 2005
- IBM J. Res. Dev
Direct measurements of the AC performance of carbon nanotube field effect transistors
- D. Singh
- Keith A. Jenkins
- 2004
- DRC 2004
CMOS IC diagnostics using the luminescence of OFF-state leakage currents
- Stas Polonsky
- Keith A. Jenkins
- et al.
- 2004
- IEEE ITC 2004