Gate movement for timing improvement on row based Dual-VDD designs
- Hua Xiang
- Lakshmi Reddy
- et al.
- 2016
- ISQED 2016
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65 results for Pong-Fei Lu
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology
- Tony Tae-Hyoung Kim
- Pong-Fei Lu
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
Long-term NBTI degradation under real-use conditions in IBM microprocessors
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2014
- Microelectronics Reliability
Row based dual-vdd island generation and placement
- Hua Xiang
- Haifeng Qian
- et al.
- 2014
- DAC 2014
On-chip circuit to monitor long-term NBTI and PBTI degradation
- Keith A. Jenkins
- Pong-Fei Lu
- 2013
- Microelectronics Reliability
A built-in BTI monitor for long-term data collection in IBM microprocessors
- Pong-Fei Lu
- Keith A. Jenkins
- 2013
- IRPS 2013
Design of ring oscillator structures for measuring isolated NBTI and PBTI
- Tony T. Kim
- Pong-Fei Lu
- et al.
- 2012
- ISCAS 2012
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
On-chip circuit for monitoring frequency degradation due to NBTI
- Kevin Stawiasz
- Keith A. Jenkins
- et al.
- 2008
- IRPS 2008