Publications

147 results for Daniel Edelstein

VLSI on-chip interconnection performance simulations and measurements
- - D. Edelstein
  - G.A. Sai-Halasz
  - et al.
- 1995
- IBM J. Res. Dev
High performance dielectrics and processes for ULSI interconnection technologies
- - J. Paraszczak
  - D. Edelstein
  - et al.
- 1993
- IEDM 1993
Electrical and physical properties of high-Ge-content Si/SiGe p-type quantum wells
- - R.A. Kiehl
  - P.E. Batson
  - et al.
- 1993
- Physical Review B
Optical measurement of internal logic patterns in a flip-chip mounted silicon SRAM integrated circuit
- - H. Heinrich
  - N. Pakdaman
  - et al.
- 1992
- LEOS 1992
Microwave properties of free-standing dielectric films
- - W. Robertson
  - G. Arjavalingam
  - et al.
- 1992
- Electronics Letters
Rapid programmable 300 ps optical delay scanner and signal-averaging system for ultrafast measurements
- - D. Edelstein
  - R.B. Romney
  - et al.
- 1991
- Review of Scientific Instruments
3-D capacitance modeling of advanced multilayer interconnection technologies
- - Daniel C. Edelstein
- 1990
- SPIE Advances in Intelligent Robotics Systems 1990