CMOS-Compatible Wearable Sensors Fabricated Using Controlled Spalling
- Katsuyuki Sakuma
- Huan Hu
- et al.
- 2019
- IEEE Sensors Journal
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100 results for Stephen W. Bedell
Rapid imaging of misfit dislocations in SiGe/Si in cross-section and through oxide layers using electron channeling contrast
- Kunal Mukherjee
- Brent A. Wacaser
- et al.
- 2017
- Applied Physics Letters
Mechanically flexible nanoscale silicon integrated circuits powered by photovoltaic energy harvesters
- Davood Shahrjerdi
- Stephen W. Bedell
- et al.
- 2016
- Solid-State Electronics
Stress determination through diffraction: Establishing the link between Kröner and Voigt/Reuss limits
- Conal E. Murray
- Jean L. Jordan-Sweet
- et al.
- 2015
- Powder Diffraction
Strain scaling for CMOS
- Stephen W. Bedell
- Ali Khakifirooz
- et al.
- 2014
- MRS Bulletin
Vertical light-emitting diode fabrication by controlled spalling
- Stephen W. Bedell
- Can Bayram
- et al.
- 2013
- Applied Physics Express
Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction
- Judson R. Holt
- Anita Madan
- et al.
- 2013
- Journal of Applied Physics
Weighted mechanical models for residual stress determination using x-ray diffraction
- Conal E. Murray
- Stephen W. Bedell
- et al.
- 2013
- Journal of Applied Physics
Layer transfer by controlled spalling
- Stephen W. Bedell
- Keith Fogel
- et al.
- 2013
- Journal of Physics D: Applied Physics
Extremely flexible nanoscale ultrathin body silicon integrated circuits on plastic
- Davood Shahrjerdi
- Stephen W. Bedell
- 2012
- Nano Letters