Estimating the efficiency of collaborative problem-solving, with applications to chip design
- M.Y.L. Wisniewski
- E. Yashchin
- et al.
- 2003
- IBM J. Res. Dev
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66 results for I.C. Noyan
Phase transformation of thin sputter-deposited tungsten films at room temperature
- S.M. Rossnagel
- I.C. Noyan
- et al.
- 2002
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Differentiating between elastically bent rectangular beams and plates
- S. Kaldor
- I.C. Noyan
- 2002
- Applied Physics Letters
Finite-size effects in thin-film composites
- Conal E. Murray
- I.C. Noyan
- 2002
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Determination of processing damage in thin polycrystalline Ir films using Bragg-peak fringe analysis
- K.L. Saenger
- I.C. Noyan
- 2001
- Journal of Applied Physics
Quantitative metrology study of Cu/SiO2 interconnect structures using fluorescence x-ray microscopy
- Guangyong Xu
- X. Su
- et al.
- 2001
- Applied Physics Letters
Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy
- X. Su
- C.B. Stagarescu
- et al.
- 2000
- Applied Physics Letters
Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics
- I.C. Noyan
- P.-C. Wang
- et al.
- 2000
- Review of Scientific Instruments
Images of local tilted regions in strain-relaxed SiGe layers
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1999
- Physica B: Condensed Matter
Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1999
- Applied Physics Letters