Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation
- S.S. Lau
- W.K. Chu
- et al.
- 1974
- Thin Solid Films
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.