Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applicationsK. ChengA. Khakifiroozet al.2009IEDM 2009
Generalized thermal analysis of hotspots on a high power density microprocessor chipKai XiuMark Ketchen2005ECTC 2005
Thermal modeling of a small extreme power density macro on a high power density microprocessor chip in the presence of realistic packaging and interconnect structuresKai XiuMark Ketchen2004ECTC 2004
Investigation of the Impact of Random Dopant Fluctuation on Static Noise Margin of 22nm SRAMSarah Q. XuKai Xiuet al.2012SISPAD 2012
Simulation of phonon-induced mobility under arbitrary stress, wafer and channel orientations and its application to FinFET technologyKai XiuPhil Oldiges2012SISPAD 2012
A Simple, unified 3D stress model for device design in stress-enhanced mobility technologiesArvind KumarKai Xiuet al.2012SISPAD 2012
Simulation of channel electron mobility due to scattering with interfacial phonon-plasmon modes in silicon nanowire under the presence of high-k oxide and metal gateKai Xiu2011SISPAD 2011
Measurement of thermal time constant in 65-nm PD-SOI technology with sub-ns resolutionMark B. KetchenKai Xiuet al.2007SOI 2007
Simulation study of reduced self-heating in novel thin-SOI vertical bipolar transistorsQiqing OuyangKai Xiu2005SISPAD 2005