Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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38 results for Victor Chan

A 45nm low power bulk technology featuring carbon co-implantation and laser anneal on 45°-rotated substrate
- - J. Yuan
  - V. Chan
  - et al.
- 2008
- ICSICT 2008
High performance transistors featured in an aggressively scaled 45nm bulk CMOS technology
- - Z. Luo
  - N. Rovedo
  - et al.
- 2007
- VLSI Technology 2007
Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- - Xiaobin Yuan
  - Jae-Eun Park
  - et al.
- 2007
- IIRW 2007
Uniaxial strain relaxation on ultra-thin strained-Si directly on insulator (SSDOI) substrates
- - Haizhou Yin
  - Z. Ren
  - et al.
- 2006
- ICSICT 2006
Integration of local stress techniques with strained-Si directly on insulator (SSDOI) substrates
- - Haizhou Yin
  - Z. Ren
  - et al.
- 2006
- VLSI Technology 2006
Process induced stress for CMOS performance improvement
- - S. Fang
  - S.S. Tan
  - et al.
- 2006
- ICSICT 2006
Interaction of middle-of-line (MOL) temperature and mechanical stress on 90nm hi-speed device performance and reliability
- - K.Y. Lim
  - V. Chan
  - et al.
- 2005
- ESSDERC 2005
Dual stress liner enhancement in hybrid orientation technology
- - C. Sheraw
  - M. Yang
  - et al.
- 2005
- VLSI Technology 2005
On the scalability and carrier transport of advanced CMOS devices
- - Meikei Ieong
  - Leland Chang
  - et al.
- 2005
- ICICDT 2005
Strain for CMOS performance improvement
- - Victor Chan
  - Ken Rim
  - et al.
- 2005
- CICC 2005