Interface Defect Formation in MOSFETs by Atomic Hydrogen Exposure
- R.E. Stahlbush
- E. Cartier
- 1994
- IEEE TNS
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182 results for Eduard Cartier
Impact ionization in silicon
- E. Cartier
- M.V. Fischetti
- et al.
- 1993
- Applied Physics Letters
Passivation and depassivation of silicon dangling bonds at the Si/SiO 2 interface by atomic hydrogen
- E. Cartier
- J.H. Stathis
- et al.
- 1993
- Applied Physics Letters
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
- D.J. DiMaria
- E. Cartier
- et al.
- 1993
- Journal of Applied Physics
Hot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interface
- E. Cartier
- D.J. DiMaria
- 1993
- Microelectronic Engineering
Theory of laser-induced free-electron heating and impact ionization in wide-band-gap solids
- D. Arnold
- E. Cartier
- 1992
- Physical Review B
Impact ionization and positive charge formation in silicon dioxide films on silicon
- D.J. DiMaria
- D. Arnold
- et al.
- 1992
- Applied Physics Letters
Acoustic-phonon runaway and impact ionization by hot electrons in silicon dioxide
- D. Arnold
- E. Cartier
- et al.
- 1992
- Physical Review B
Degradation and breakdown of silicon dioxide films on silicon
- D.J. Dimaria
- D. Arnold
- et al.
- 1992
- Applied Physics Letters
Hot-electron dynamics in SiO2 studied by soft-x-ray-induced core-level photoemission
- E. Cartier
- F.R. McFeely
- 1991
- Physical Review B