Effects of annealing on the local structure of Fe and Co in CoFeB/MgO/CoFeB tunnel junctions: An extended x-ray-absorption fine structure study
- Abdul K. Rumaiz
- J.C. Woicik
- et al.
- 2010
- Applied Physics Letters
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152 results for Jean L. Jordan-Sweet
In situ X-ray diffraction study of thin film Ir/Si solid state reactions
- W. Knaepen
- J. Demeulemeester
- et al.
- 2010
- Microelectronic Engineering
In situ study of the formation of silicide phases in amorphous Co-Si mixed layers
- C. Van Bockstael
- K. De Keyser
- et al.
- 2010
- Microelectronic Engineering
Morphological stability and specific resistivity of sub-10 nm silicide films of Ni1-x Ptx on Si substrate
- Zhen Zhang
- Shi Li Zhang
- et al.
- 2010
- Applied Physics Letters
In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing
- W.G. Wang
- J.L. Jordan-Sweet
- et al.
- 2009
- Applied Physics Letters
In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100)
- W. Knaepen
- J. Demeulemeester
- et al.
- 2009
- JVSTA
Phase transitions in Ge-Te phase change materials studied by time-resolved x-ray diffraction
- Simone Raoux
- Becky Mun̈oz
- et al.
- 2009
- Applied Physics Letters
In situ study of the formation of silicide phases in amorphous Ni-Si mixed layers
- C. Van Bockstael
- C. Detavernier
- et al.
- 2009
- Journal of Applied Physics
Method to measure the viscosity of nanometer liquid films from the surface fluctuations
- Zhaohui Yang
- Chi-Hang Lam
- et al.
- 2009
- Applied Physics Letters
Annealing behavior of atomic layer deposited HfO2 films studied by synchrotron x-ray reflectivity and grazing incidence small angle scattering
- M.L. Green
- A.J. Allen
- et al.
- 2009
- Journal of Applied Physics