Texture transformations in reactive metal films deposited upon amorphous substrates
- D. Dunn
- R. Hull
- et al.
- 2001
- Journal of Applied Physics
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228 results for Rudolf M. Tromp
Advances in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si
- Ruud M. Tromp
- Frances M. Ross
- 2000
- Annual Review of Materials Science
In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si (001) heterostructures
- E.A. Stachf
- R. Hull
- et al.
- 2000
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Low-energy electron microscopy
- Rudolf M. Tromp
- 2000
- IBM J. Res. Dev
Growth kinetics of CoSi2 and Ge islands observed with in situ transmission electron microscopy
- F.M. Ross
- P.A. Bennett
- et al.
- 1999
- Micron
Interactions of moving dislocations in semiconductors with point, line and planar defects
- R. Hull
- E.A. Stach
- et al.
- 1999
- Physica Status Solidi (A) Applied Research
Hot Electron Emission Lithography: A method for efficient large area e-beam projection
- M. Poppeller
- E. Cartier
- et al.
- 1999
- Microelectronic Engineering
Hot electron emission lithography
- M. Poppeller
- E. Cartier
- et al.
- 1998
- Applied Physics Letters
In situ transmission electron microscopy observations of the formation of self-assembled ge islands on Si
- F.M. Ross
- J. Tersoff
- et al.
- 1998
- Microscopy Research and Technique
Effect of the surface upon misfit dislocation velocities during the growth and annealing of SiGe/Si (001) heterostructures
- E.A. Stach
- R. Hull
- et al.
- 1998
- Journal of Applied Physics