A High-Speed 128Kbit MRAM Core for Future Universal Memory Applications
- A. Bette
- J.K. DeBrosse
- et al.
- 2003
- VLSI Circuits 2003
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24 results for J. DeBrosse
Challenges and future directions for the scaling of dynamic random-access memory (DRAM)
- Jack A. Mandelman
- Robert H. Dennard
- et al.
- 2002
- IBM J. Res. Dev
A 7F2 cell and bitline architecture featuring tilted array devices and penalty-free vertical BL twists for 4-Gb DRAM's
- Heinz Hoenigschmid
- Alexander Frey
- et al.
- 2000
- IEEE Journal of Solid-State Circuits
A 220-mm2, four- and eight-bank, 256-Mb SDRAM with single-sided stitched WL architecture
- Toshiaki Kirihata
- Martin Gall
- et al.
- 1998
- IEEE Journal of Solid-State Circuits
0.21 μm2 7F2 trench cell with a locally-open globally-folded dual bitline for 1 Gb/4 Gb DRAM
- C. Radens
- U. Gruening
- et al.
- 1998
- VLSI Technology 1998
220 mm2 4 and 8 bank 256 Mb SDRAM with single-sided stitched WL architecture
- T. Kirihata
- M. Gall
- et al.
- 1998
- ISSCC 1998
Flexible test mode approach for 256-Mb DRAM
- Toshiaki Kirihata
- Hing Wong
- et al.
- 1997
- IEEE Journal of Solid-State Circuits
Floating-body concerns for SOI dynamic random access memory (DRAM)
- J.A. Mandelman
- J. Barth
- et al.
- 1996
- IEEE International SOI Conference 1996
Flexible test mode design for DRAM characterization
- H. Wong
- T. Kirihata
- et al.
- 1996
- VLSI Circuits 1996
Fault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEEE Journal of Solid-State Circuits