Ultra low contact resistivities for CMOS beyond 10-nm nodeZhen ZhangSiyuranga Obasa Koswattaet al.2013IEEE Electron Device Letters
Sharp reduction of contact resistivities by effective schottky barrier lowering with silicides as diffusion sourcesZhen ZhangF. Pagetteet al.2010IEEE Electron Device Letters
Effective schottky barrier lowering for contact resistivity reduction using silicides as diffusion sourcesZhen ZhangF. Pagetteet al.2010VLSI-TSA 2010