Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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24 results for D. Fried

22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL
- - S. Narasimha
  - P. Chang
  - et al.
- 2012
- IEDM 2012
Challenges and opportunities for high performance 32 nm CMOS technology
- - J. Sleight
  - I. Lauer
  - et al.
- 2006
- IEDM 2006
Integration and optimization of embedded-SiGe, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies
- - M. Horstmann
  - A. Wei
  - et al.
- 2005
- IEDM 2005
High performance 65 nm SOI technology with enhanced transistor strain and advanced-low-K BEOL
- - W.-H. Lee
  - A. Waite
  - et al.
- 2005
- IEDM 2005
Aggressively scaled (0.143 μm ²) 6T-SRAM cell for the 32 nm node and beyond
- - D. Fried
  - J. Hergenrother
  - et al.
- 2004
- IEDM 2004
Metal-gate FinFET and fully-depleted SOI devices using total gate silicidation
- - Jakub Kedzierski
  - Edward Nowak
  - et al.
- 2002
- IEDM 2002
A functional FinFET-DGCMOS SRAM cell
- - E. Nowak
  - B. Rainey
  - et al.
- 2002
- IEDM 2002
22nm technology yield optimization using multivariate 3D virtual fabrication
- - B. Cipriany
  - B. Jagannathan
  - et al.
- 2013
- SISPAD 2013
A simple hardware-based statistical model on 65nm SOI CMOS technology
- - Q. Liang
  - J.B. Johnson
  - et al.
- 2007
- ISDRS 2007
SOI CMOS technology with 360GHz f_T NFET, 260GHz f_T PFET, and record circuit performance for millimeter-wave digital and analog system-on-chip applications
- - Sungjae Lee
  - Jonghae Kim
  - et al.
- 2007
- VLSI Technology 2007