A new two-dimensional particle detector for a toroidal electrostatic analyzer
- R.M. Tromp
- M. Copel
- et al.
- 1991
- Review of Scientific Instruments
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108 results for Mark C. Reuter
Defect self-annihilation in surfactant-mediated epitaxial growth
- M. Horn-Von Hoegen
- F. Legoues
- et al.
- 1991
- Physical Review Letters
Design of a new photo-emission/low-energy electron microscope for surface studies
- R.M. Tromp
- M.C. Reuter
- 1991
- Ultramicroscopy
Influence of surfactants in Ge and Si epitaxy on Si(001)
- M. Copel
- M.C. Reuter
- et al.
- 1990
- Physical Review B
Surfactants in epitaxial growth
- M. Copel
- M.C. Reuter
- et al.
- 1989
- Physical Review Letters
Structure of the Si(111)/CaF2 interface
- R.M. Tromp
- M.C. Reuter
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Structure of the Si(111)-CaF2 interface
- R.M. Tromp
- M.C. Reuter
- 1988
- Physical Review Letters
Auger analyzer translation using ball bushings
- M.C. Reuter
- R.M. Tromp
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films