Angular distribution of particles sputtered from metals and alloys
- A. Wucher
- W. Reuter
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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38 results for W. Reuter
Relative elemental sensitivity factors in secondary neutral mass spectrometry
- A. Wucher
- F. Novak
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
A SIMS-XPS study on silicon and germanium under O+2 bombardment
- W. Reuter
- 1986
- Nuclear Inst. and Methods in Physics Research, B
Techniques for the compositional and chemical state analysis of surfaces and thin films
- W. Reuter
- 1983
- Nuclear Instruments and Methods In Physics Research
Low defect density amorphous hydrogenated silicon prepared by homogeneous chemical vapor deposition
- B.A. Scott
- J.A. Reimer
- et al.
- 1982
- Applied Physics Letters
Positive secondary-ion emission from Fe-Ni alloys under O+2 bombardment at 45° incidence
- W. Reuter
- M.L. Yu
- 1982
- Journal of Applied Physics
Anomalous diffusion behavior of Mg in GaAs
- M.B. Small
- R.M. Potemski
- et al.
- 1982
- Applied Physics Letters
Surface compositional modifications during O+2 bombardment of binary alloys
- Ming L. Yu
- Wilhad Reuter
- 1981
- Applied Physics Letters
Probe layer measurements of electroluminescence excitation in ac thin-film devices
- V. Marrello
- L. Samuelson
- et al.
- 1981
- Journal of Applied Physics
Secondary ion emission from binary alloy systems. Part I: O +2 bombardment
- Ming L. Yu
- Wilhad Reuter
- 1981
- Journal of Applied Physics