Electromigration of Ni in Al thin-film conductors
- F.M. D'Heurle
- A. Gangulee
- et al.
- 2008
- Journal of Applied Physics
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159 results for F.M. D'Heurle
Schottky-barrier height of iridium silicide
- I. Ohdomari
- K.N. Tu
- et al.
- 2008
- Applied Physics Letters
An alternative marker experiment in the formation of Mo and W silicides
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 2008
- Applied Physics Letters
Oxidation mechanisms in WSi2 thin films
- S. Zirinsky
- W.N. Hammer
- et al.
- 2008
- Applied Physics Letters
Measurements of the rectifying barrier heights of the various iridium silicides with n-Si
- J. De Sousa Pires
- P. Ali
- et al.
- 2008
- Applied Physics Letters
Nucleation-controlled thin-film interactions: Some silicides
- R.L. Anderson
- J.E.E. Baglin
- et al.
- 2008
- Applied Physics Letters
The interaction process for Ag-Al polycrystalline thin-film couples
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 2008
- Journal of Applied Physics
Formation of iridium silicides from Ir thin films on Si substrates
- S. Petersson
- J.E.E. Baglin
- et al.
- 2008
- Journal of Applied Physics
The formation of silicides from thin films of some rare-earth metals
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 2008
- Applied Physics Letters
Measurements of the rectifying barrier heights of various rhodium silicides with n-silicon
- J. De Sousa Pires
- F.M. D'Heurle
- et al.
- 2008
- Applied Physics Letters