Defect microchemistry at the SiO2/Si interface
- G.W. Rubloff
- K. Hofmann
- et al.
- 1987
- Physical Review Letters
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72 results for G.W. Rubloff
High-temperature SiO2 decomposition at the SiO2/Si interface
- R.M. Tromp
- G.W. Rubloff
- et al.
- 1985
- Physical Review Letters
Microscopic compound formation at the Pd-Si(111) interface
- J. Freeouf
- G.W. Rubloff
- et al.
- 1979
- Physical Review Letters
Optical reflectance spectroscopy of surface states in H2 chemisorption on W(100)
- G.W. Rubloff
- J.R. Anderson
- et al.
- 1974
- Physical Review Letters
Role of surface passivation in the integrated processing of MOS structures
- M. Offenberg
- M. Liehr
- et al.
- 1990
- VLSI Technology 1990
HF surface passivation failure in integrated thermal oxidation processing
- M. Liehr
- M. Offenberg
- et al.
- 1990
- SSDM 1990
Fundamentals of laser photoemission for testing high speed devices and circuits
- G.W. Rubloff
- H. Beha
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Exciton transport in SiO2 as a possible cause of surface-state generation in MOS structures
- Z.A. Weinberg
- G.W. Rubloff
- 2008
- Applied Physics Letters
Exciton or hydrogen diffusion in SiO2?
- Z.A. Weinberg
- D.R. Young
- et al.
- 2008
- Journal of Applied Physics
Thin-film transformations and volatile products in the formation of nanoporous low- k polymethylsilsesquioxane-based dielectric
- P. Lazzeri
- L. Vanzetti
- et al.
- 2005
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures