Performance Limits of CMOS ULSI
- James R. Pfiester
- John D. Shott
- et al.
- 1985
- IEEE T-ED
Publications
465 results at IEEE T-ED
Correlation Between the Diffusive and Electrical Barrier Properties of the Interface in Polysilicon Contacted n+-p Junctions
- Johannes M.C. Stork
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
Correlations of Photoluminescence with Defect Densities in Semi-Insulating Gallium Arsenide
- Harold J. Hovel
- D. Guidotti
- 1985
- IEEE T-ED
Increasing the Current Driving Capability of Epitaxial Schottky-Barrier Diodes Using High-Energy Implantation
- C.T. Chuang
- G.P. Li
- et al.
- 1985
- IEEE T-ED
Techniques for Small-Signal Analysis of Semiconductor Devices
- Steven E. Laux
- 1985
- IEEE T-ED
Temperature Dependence of FET Properties for Cr-Doped and LEC Semi-Insulating GaAs Substrates
- Thomas W. Hickmott
- 1984
- IEEE T-ED
Evolution of the MOSFET Dynamic RAM—A Personal View
- Robert H. Dennard
- 1984
- IEEE T-ED
A Schottky-Barrier Diode With Self-Aligned Floating Guard Ring
- C.T. Chuang
- Maurizio Arienzo
- et al.
- 1984
- IEEE T-ED
Electromigration Lifetime Sudies of Submicrometer-Linewidth Al-Cu Conductors
- Subramanian S. Iyer
- Chung-YU Ting
- 1984
- IEEE T-ED
Accuracy of an Effective Channel Length/External Resistance Extraction Algorithm for MOSFET's
- Steven E. Laux
- 1984
- IEEE T-ED