Sources of conduction band polarization in the driving force for electromigrationRolf Landauer1975Thin Solid Films
Implanted noble gas atoms as diffusion markers in silicide formationW.K. ChuS.S. Lauet al.1975Thin Solid Films
Absence of non-shorting breakdown behaviour in AlSi3N4Si structuresN. KleinC.M. Osburnet al.1975Thin Solid Films
Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formationS.S. LauW.K. Chuet al.1974Thin Solid Films
Nucleation of small metal particles on ultrathin SiO2 films on SiL. KasprzakR.B. Laibowitzet al.1974Thin Solid Films
Grain boundary self-diffusion in evaporated Au films at low temperaturesD. GuptaK.W. Asai1974Thin Solid Films
The correlation between light-induced metallic film voltages and time-dependent temperature gradientsR.J. von GutfeldP. Zory1974Thin Solid Films
Calculations of elastic scattering of 4He projectiles from thin layersJ.F. ZieglerR.F. Lever1973Thin Solid Films