Summary Abstract: Quantitative particulate contamination studies utilizing reduced turbulence pumping and ventingPeter D. Hoh1984JVSTA
Summary Abstract: Electromigration studies of al-intermetallic structuresT. KwokP.S. Hoet al.1984JVSTA
Geometric structure and electronic states of copper films on a ruthenium (0001) surfaceJ.C. VickermanK. Christmannet al.1983Surface Science
Transmission electron microscopy for optical storage material analysisS.R. HerdK.Y. Ahn1983Thin Solid Films
The stability of thin tellurium and tellurium alloy films for optical data storage: IIWen-Yaung Lee1983Thin Solid Films
Fabrication and testing of trilayers with a high deposition rate plasma-polymerized spacerN.J. MazzeoK.Y. Ahnet al.1983Thin Solid Films