The Effect of film thickness on the electrical properties of LPCVD polysilicon films
- T.T. Sheng
- C.C. Shih
- et al.
- 1984
- JES
Publications
Date
Featured collections
Popular topics
509 results at JES
Dielectric Breakdown Properties of SiO2 Films Grown in Halogen and Hydrogen-Containing Environments
- C.M. Osburn
- 1974
- JES
Synthesis of Photochromic and Cathodochromic Sodalite
- I.F. Chang
- 1974
- JES
Sodium-Induced Barrier-Height Lowering and Dielectric Breakdown on SiO2 Films on Silicon
- C.M. Osburn
- D.W. Ormond
- 1974
- JES
A Lattice Parameter Criterion for Miscibility Gaps in the III-V and II-VI Pseudobinary Solid Solutions
- L.M. Foster
- 1974
- JES
The Effects of Trace Amounts of Water on the Thermal Oxidation of Silicon in Oxygen
- E.A. Irene
- 1974
- JES
Phosphorus Diffusion in Partially Crystallized Films of SiO2
- D.R. Campbell
- E.I. Alessandrini
- et al.
- 1974
- JES
The Effect of Silicon Wafer Imperfections on Minority Carrier Generation and Dielectric Breakdown in MOS Structures
- C.M. Osburn
- D.W. Ormond
- 1974
- JES
Field Effect Modulated Photoluminescence in ZnO
- T.O. Sedgwick
- 1974
- JES
Catalyzed Crystallization in SiO2 Thin Films
- E.I. Alessandrini
- D.R. Campbell
- 1974
- JES