Performance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillator
- Chih-Hsiang Ho
- Keith A. Jenkins
- et al.
- 2015
- IEEE T-ED
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Variability aware simulation based design-technology cooptimization (DTCO) Flow in 14 nm FinFET/SRAM cooptimization
- Asen Asenov
- Binjie Cheng
- et al.
- 2015
- IEEE T-ED
Transistor Matching and Fin Angle Variation in FinFET Technology
- Samarth Agarwal
- Terence B. Hook
- et al.
- 2015
- IEEE T-ED
Random dopant fluctuation induced variability in undoped channel si gate all around nanowire n-MOSFET
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2015
- IEEE T-ED
On the origin of steep i - V nonlinearity in mixed-ionic-electronic-conduction-based access devices
- Alvaro Padilla
- Geoffrey W. Burr
- et al.
- 2015
- IEEE T-ED
Series stacked multipath inductor with high self resonant frequency
- Venkata Nr Vanukuru
- Anjan Chakravorty
- 2015
- IEEE T-ED
Frequency-modulated charge pumping with extremely high gate leakage
- Jason T. Ryan
- Jibin Zou
- et al.
- 2015
- IEEE T-ED
A four-FET method for extracting mobility in FETs without field oxide
- Amlan Majumdar
- Ko-Tao Lee
- et al.
- 2014
- IEEE T-ED
Design of novel high-Q multipath parallel-stacked inductor
- Venkata Narayana Rao Vanukuru
- Anjan Chakravorty
- 2014
- IEEE T-ED
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2014
- IEEE T-ED