Effect of band alignment and density of states on the collector current in p-Si/n-Si1-yCy/p-Si HBTs
- Dinkar V. Singh
- Judy L. Hoyt
- et al.
- 2003
- IEEE Transactions on Electron Devices
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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134 results at IEEE Transactions on Electron Devices
Improved hot-carrier and short-channel performance in vertical nMOSFETs with graded channel doping
- Xiangdong Chen
- Qiqing Christine Ouyang
- et al.
- 2002
- IEEE Transactions on Electron Devices
Electron and hole mobility enhancement in strained SOI by wafer bonding
- Lijuan Huang
- Jack O. Chu
- et al.
- 2002
- IEEE Transactions on Electron Devices
FinFET design considerations based on 3-D simulation and analytical modeling
- Gen Pei
- Jakub Kedzierski
- et al.
- 2002
- IEEE Transactions on Electron Devices
Quantum simulations of an ultrashort channel single-gated n-MOSFET on SOI
- J. Knoch
- B. Lengeler
- et al.
- 2002
- IEEE Transactions on Electron Devices
Floating-island TFT leakage caused by process step reduction
- Takatoshi Tsujimura
- Osamu Tokuhiro
- et al.
- 2002
- IEEE Transactions on Electron Devices
Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
- Kangguo Cheng
- Jinju Lee
- et al.
- 2002
- IEEE Transactions on Electron Devices
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
- Franco Stellari
- Franco Zappa
- et al.
- 2001
- IEEE Transactions on Electron Devices
Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
- Yuan Taur
- 2001
- IEEE Transactions on Electron Devices
History and future perspective of the modern silicon bipolar transistor
- T.H. Ning
- 2001
- IEEE Transactions on Electron Devices