High-Q characteristics of variable width inductors with reverse excitation
- Venkata Narayana Rao Vanukuru
- Anjan Chakravorty
- 2014
- IEEE T-ED
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Study of synaptic behavior in doped transition metal oxide-based reconfigurable devices
- Saptarshi Mandal
- Branden Long
- et al.
- 2013
- IEEE T-ED
Modeling and characterization of gate leakage in high-K metal gate technology-Based embedded DRAM
- Mohit Bajaj
- Rajan K. Pandey
- et al.
- 2013
- IEEE T-ED
Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED
Compact model for carbon nanotube field-effect transistors including nonidealities and calibrated with experimental data down to 9-nm gate length
- Jieying Luo
- Lan Wei
- et al.
- 2013
- IEEE T-ED
Meeting the challenge of multiple threshold voltages in highly scaled undoped FinFETs
- Ramachandran Muralidhar
- Jin Cai
- et al.
- 2013
- IEEE T-ED
Contact-induced negative differential resistance in short-channel graphene FETs
- Roberto Grassi
- Tony Low
- et al.
- 2013
- IEEE T-ED
Electrical resistivity of liquid Ge2Sb2Te5 based on thin-film and nanoscale device measurements
- Kadir Cil
- Faruk Dirisaglik
- et al.
- 2013
- IEEE T-ED
Specifications of nanoscale devices and circuits for neuromorphic computational systems
- Bipin Rajendran
- Yong Liu
- et al.
- 2013
- IEEE T-ED
Probing the interface barriers of dopant-segregated silicide-Si diodes with internal photoemission
- Zhen Zhang
- Joanna Atkin
- et al.
- 2012
- IEEE T-ED